Computing the Expected Value of Sample Information Efficiently: Expertise and Skills Required for Four Model-Based Methods
N Kunst,
E Wilson,
F Alarid-Escudero,
G Baio,
A Brennan,
M Fairley,
D Glynn,
J Goldhaber-Fiebert,
C Jackson,
H Jalal,
N Menzies,
M Strong,
H Thom,
A Heath
January 2019
